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Exam will be comprehensive, here you will find some questions to guide your study.

See questions suggested for Fall 2011 exam here .

See the 2011 exam here, the 2010 exam here, and the 2007 exam here.

Older questions (from Fall 2010):

Auger spectroscopy

  • Meaning of transition nomenclature, eg. what is a KLL transition?
  • What is the maximum depth of AES?
  • Can Auger electrons be non-core electrons?
  • Why is AES a more qualitative than quantitative technique?
  • What pressure is best when performing an AES measurement?
  • Can the Auger electron emission process be initiated with x-rays?
  • Besides the beam electrons, how many electrons are involved in AES?
  • Is the kinetic energy of the Auger electrons dependent on the beam energy?
  • Do sample charging change the kinetic energy of the Auger electrons?
  • What are the typical beam energies used in AES?
  • Do sample charging and environmental shifts refer to the same effect in AES?
  • Do environmental shifts and chemical shifts refer to the same effect in AES?
  • Can photoelectrons be emitted during an AES measurement?
  • What does Auger sensitivity refers to?
  • Does the Auger sensitivity depend on the electron beam energy?
  • What does the background of an Auger spectrum is composed of?
  • Why are Auger spectra broader than XPS spectra?
  • Why is the AES uses dN/dE instead of N(E) directly?
  • Can there be an Auger electron emission without the emission of a photoelectron?
  • Can He emit Auger electrons?
  • What is the role of the electron multiplier in the AES equipment?

X-ray photoelectron spectroscopy

  • Can x-rays eject non-core electrons?
  • What is the maximum depth of XPS?
  • Why is XPS a more qualitative than quantitative technique?
  • How many electrons are involved in XPS?
  • What pressure is best when performing an XPS measurement?
  • Is the kinetic energy of the photoelectron dependent on the X-ray beam energy?
  • Do sample charging change the kinetic energy of the photoelectrons?
  • What are the typical x-ray beam energies used in XPS?
  • Do sample charging and environmental shifts refer to the same effect in XPS?
  • Do environmental shifts and chemical shifts refer to the same effect in XPS?
  • Can Auger electrons be emitted during an XPS measurement?
  • Why is the XPS does not use dN/dE instead of N(E)?
  • What does x-ray photoelectron sensitivity refers to?
  • Does the x-ray photoelectron sensitivity depend on the x-ray beam energy?
  • What does the background of an XPS spectrum is composed of?
  • Can there be photoelectron emission without the emission of an Auger electron?
  • Can XPS be used to identify hydrogen?
  • Is there a need for an electron multiplier in the XPS equipment?
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