Versions Compared

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.

This page is operated by the Surface Physics Group of UTEP.

For questions contact

or

Equipment

 (to be reviewed)

PHYSICAL ELECTRONICS / PHI 5600 XPS X-ray photoelectron spectrometer 
  • PHI 5600 XPS X-ray photoelectron Spectrometer

Includes monochromator and OMNI III lens and MCD detector and scanning AES option. 
  •  
  • Orion 5
  • MARKUS 10
  • Specifications of equipment
  • OmniFocus III small area lens 
  • Multi channel detector 
  • 10-360 spherical capacitor analyzer 
  • Includes monochromator and OMNI III lens and MCD detector and scanning AES option. 
  • XPS sensitivity:
 
  • Magnesium anode specified performance obtained with single Mg anode operating at 400 W (26.7 mA and 15 kV) on a sample of clean silver. 
  • Analysis area:
 
  • Selected by an externally fixed 1-position aperture and by a computer-controlled analyzer (150 um analysis area) 
Count rates less than standard system due to non-standard geometry 
  • Environmental requirements: 
  • Magnetic fields: less than 0.3 uT (3 mG) peak-to-peak, alternating field, less than 1G static field 
Relative humidity: less than 70% 
Temperature: 20°C ± 5°C 
  • Heat dissipation: 3,000 W under typical operating conditions, 10,000 W additional during system breakout 
Vibration: not to exceed 10 um at 0.1-60 Hz 
  • Utility requirements: 200-240 VAC, 1 phase, 50-60 Hz, 50 A (to be hardwired to separate 60 A branch circuit by customer) 
  • Dry nitrogen: 0.279 kg/cm^2 (4 psi) max 
  • Compressed air: 5.6 to 7.0 kg/cm^2 at 0.17 m^3/hr (80 to 100 psig at 0.1 CFM), pressure-regulated for vibration-isolated console and automatic valve control options only

To be replaced

PHI X-ray Photoelectron Spectroscopy system