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PHI 5600: Hemispherical Energy Analyzer

Description of Hemispherical Energy Analyzer

  • Ultimate resolution
  • Superior performance in XPS, UPS, AES, ISS
  • Excellent sensitivity
  • Modular detector concept
  • Angular mapping
  • High pressure XPS
  • Small spot XPS analysis
  • XPS imaging

     

Product Description:
SPECS continues to set new standards with the PHOIBOS series of hemispherical energy analyzers. This instrument combines excellent performance and highest reliability for the largest possible variety of experimental conditions. The most advanced and sophisticated computer simulations were used to fully characterize and optimize the electron optical properties of the analyzer and transfer lens. The PHOIBOS energy analyzer is available with 100, 150 and 225 mm
  • Resolution of 0.05 eV ???
  • Sensitivity ???
  • Angular mapping (angular range ???)
  • Pressure needed ???
  • XPS imaging ???

Product Description:
The energy analyzer has a 150 mm mean radius. Due to the modular concept of the construction it can be easily adapted to meet special requirements. For ultimate performance the energy analyzer and the lens system are constructed entirely from non-magnetic materials inside the µ-metal shielding. Additionally, a mesh-covered hole is placed in the outer hemisphere in line-of-sight of the lens axis in order to reduce the scattered intensity

 

      PHOIBOS 150

CONTACT: Jorge A. López (jorgelopez@utep.edu)

BACKTO PHI 5600 XPS X-ray photoelectron Spectrometer