This page is operated by the Surface Physics Group of UTEP.
For questions contact
- Dr. Jorge A. Lopez (jorgelopez@utep.edu),
- Dr. Carlos Diaz Moreno (carlos.alejandro.diaz.moreno@gmail.com)
- Enrique Ramirez-Homs (enraho@gmail.com).
Equipment
- PHI 5600 XPS X-ray photoelectron Spectrometer
- Orion 5
- MARKUS 10
- Specifications of equipment
- OmniFocus III small area lens
- Multi channel detector
- 10-360 spherical capacitor analyzer
- Includes monochromator and OMNI III lens and MCD detector and scanning AES option.
- XPS sensitivity: Magnesium anode specified performance obtained with single Mg anode operating at 400 W (26.7 mA and 15 kV) on a sample of clean silver.
- Analysis area: Selected by an externally fixed 1-position aperture and by a computer-controlled analyzer (150 um analysis area)
- Environmental requirements:
- Magnetic fields: less than 0.3 uT (3 mG) peak-to-peak, alternating field, less than 1G static field
- Heat dissipation: 3,000 W under typical operating conditions, 10,000 W additional during system breakout
- Utility requirements: 200-240 VAC, 1 phase, 50-60 Hz, 50 A (to be hardwired to separate 60 A branch circuit by customer)
- Dry nitrogen: 0.279 kg/cm^2 (4 psi) max
- Compressed air: 5.6 to 7.0 kg/cm^2 at 0.17 m^3/hr (80 to 100 psig at 0.1 CFM), pressure-regulated for vibration-isolated console and automatic valve control options only
To be replaced